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Super-Resolution via Recapture and Bayesian Effect Modeling

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Permanent URL	http://hdl.lib.byu.edu/1877/2488
Title	Super-Resolution via Recapture and Bayesian Effect Modeling
BYU Creator	Morse, Bryan S. Seppi, Kevin D. Toronto, Neil Ventura, Dan A.
Keywords	Bayesian edge inference; BEI; super-resolution; recapture
Description/Abstract	This paper presents Bayesian edge inference (BEI), a single-frame super-resolution method explicitly grounded in Bayesian inference that addresses issues common to existing methods. Though the best give excellent results at modest magnification factors, they suffer from gradient stepping and boundary coherence problems by factors of 4x. Central to BEI is a causal framework that allows image capture and recapture to be modeled differently, a principled way of undoing downsampling blur, and a technique for incorporating Markov random field potentials arbitrarily into Bayesian networks. Besides addressing gradient and boundary issues, BEI is shown to be competitive with existing methods on published correctness measures. The model and framework are shown to generalize to other reconstruction tasks by demonstrating BEI’s effectiveness at CCD demosaicing and inpainting with only trivial changes.
Source	N. Toronto, B. Morse, D. Ventura, and K. Seppi, "Super-resolution via recapture and Bayesian effect modeling" in IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR), pp. 2388-2395, June 2009.;
Publisher	IEEE
Date Original	2009-06
Date Digital	2010-09-21
Language	English eng en
Publication Type	Articles
Type	Text
Format	application/pdf
Owning Institution	Brigham Young University
BYU College	College of Physical and Mathematical Sciences
BYU Department	Computer Science
Copyright Status	(c) 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.;
Copyright Use Information	http://www.lib.byu.edu/generic_copyright.html

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