Correlation of Fault-Injection to Proton Accelerator Persistent Cross Section Measurements

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Permanent URL	http://hdl.lib.byu.edu/1877/63
Title	Correlation of Fault-Injection to Proton Accelerator Persistent Cross Section Measurements
BYU Creator	Morgan, Keith S. Wirthlin, Michael J.
Keywords	FPGA; Reliability; SEU
Description/Abstract	Sponsorship: Los Alamos National Laboratory. Field Programmable Gate Arrays (FPGAs) are an attractive solution for space system electronics. Unfortunately, FPGAs are susceptible to radiation-induced single-event upsets (SEU). As such, the FPGA Reliability Studies research group (http://reliability.ee.byu.edu) at Brigham Young University has studied ways to effectively measure the static, dynamic and persistent cross sections of an FPGA desgin; each of which are characterized in some way by how the part reacts to an SEU. One such method is to actually radiate an FPGA and monitor how it reacts to SEUs. A cheaper, more efficient solution is to use faultinjection to emulate SEUs. In order to validate the use of fault-injection to measure the persistent cross section of an FPGA design, we measured the persistent cross section of several designs using proton irradiation at Crocker Nuclear Laboratory in Davis, CA. Our goal was to show a high correlation between accelerator and simulation data to prove that faultinjection is a reliable alternative to proton irradation. This document is a detailed description of the correlation process.
Publisher	Los Alamos National Laboratory
Date Original	2005-06-24
Date Digital	2005-07-25
Language	English eng en
Publication Type	Peer-Reviewed Articles
Type	Text
Format	application/pdf
Owning Institution	Brigham Young University
BYU College	Ira A. Fulton College of Engineering and Technology
BYU Department	Electrical and Computer Engineering
Copyright Status	(c) 2005 Los Alamos National Laboratory;
Copyright Use Information	http://www.lib.byu.edu/generic_copyright.html

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Correlation of Fault-Injection to Proton Accelerator Persistent Cross Section Measurements

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