Detection of Configuration Memory Upsets Causing Persistent Errors in SRAM-based FPGAs

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Permanent URL	http://hdl.lib.byu.edu/1877/51
Title	Detection of Configuration Memory Upsets Causing Persistent Errors in SRAM-based FPGAs
BYU Creator	Johnson, D. Eric Morgan, Keith S. Wirthlin, Michael J.
Creator	Caffrey, Michael P. Graham, Paul S.
Keywords	Configuration Upset; Fault Modeling; FPGA Reliability
Description/Abstract	Sponsorship: Los Alamos National Laboratory. FPGA designers are becoming increasingly aware of fault tolerance issues in modern FPGA designs, especially designs destined for a radiation environment. We classify errors due to upsets within the configuration bitstream into two categories; namely, persistent and non-persistent. Persistent errors generally cannot be tolerated. However, non-persistent errors can be tolerated in certain types of designs as long as they are properly accounted for. We discuss situations in which non-persistent errors are acceptable, and describe a technique for the detection of upsets causing persistent errors within the configuration memor of an SRAM-based FPGA.
Source	D. Eric Johnson, Keith S. Morgan, Michael J. Wirthlin, Michael P. Caffrey, and Paul Graham, Detection of Configuration Memory Upsets Causing Persistent Errors in SRAM-based FPGAs, 7th Annual International Conference on Military and Aerospace Programmable Logic Devices (MAPLD), Paper 135, September 2004;
Publisher	NASA Office of Logic Design
Date Original	2004-09
Date Digital	2004-10-14
Language	English eng en
Publication Type	Peer-Reviewed Articles
Type	Text
Format	application/pdf
Owning Institution	Brigham Young University
BYU College	Ira A. Fulton College of Engineering and Technology
BYU Department	Electrical and Computer Engineering
Copyright Status	(c) 2004 Los Alamos National Laboratory;
Copyright Use Information	http://www.lib.byu.edu/generic_copyright.html

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Detection of Configuration Memory Upsets Causing Persistent Errors in SRAM-based FPGAs

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