Sponsorship: AMIS--American Micro-Systems, Inc. This paper investigates the linearity of submicron gate length CMOS devices and their behavior in open loop voltage to current (V-I) converters. Methods are developed to estimate the deviation from linearity in V-I converters due to short-channel effects. Using these methods, a converter is designed and fabricated on a 0.35 micron process. The measured deviation from linearity is less than 1% and the simulated bandwidth is 1 GHz.